| 1 | Fevzi Belli and Mutlu Beyazit and Andr{\'{e}} Takeshi Endo and Aditya P. Mathur and Adenilso da Silva Sim{\~{a}}o
Fault domain-based testing in imperfect situations: a heuristic approach and case studies
Software Quality Journal, 23(3), 2015. |
|
| | Abstract: Available soon... |
| | @ARTICLE{belli_SQJ_15,
author = {Fevzi Belli and Mutlu Beyazit and Andr{\'{e}} Takeshi Endo and Aditya P. Mathur and Adenilso da Silva Sim{\~{a}}o},
title = {Fault domain-based testing in imperfect situations: a heuristic approach and case studies},
journal = {Software Quality Journal},
year = {2015},
month = {},
volume = {23},
number = {3},
pages = {423--452}
} |
| 2 | Marcio Eduardo Delamaro and Jose Carlos Maldonado and Alberto Pasquini and Aditya P. Mathur
Interface Mutation Test Adequacy Criterion: An Empirical Evaluation
Empirical Software Engineering, 6(2), June 2001. |
|
| | Abstract: An experiment was conducted to evaluate an inter-procedural test adequacy criterion named Interface Mutation. Program SPACE, developed for the European Space Agency (ESA), was used in this experiment. The development record available for this program was used to find the faults uncovered during its development. Using this information the test process was reproduced starting with a version of SPACE containing several faults and then applying Interface Mutation. Thus we could evaluate the fault revealing effectiveness of Interface Mutation. Results from the experiment suggest that (a) the application of Interface Mutation favors the selection of fault revealing test cases when they exist and (b) Interface Mutation tends to select fault revealing test cases more efficiently than in the case where random selection is used. |
| | @ARTICLE{DelamaroMPM01,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado and Alberto Pasquini and Aditya P. Mathur},
title = {Interface Mutation Test Adequacy Criterion: An Empirical Evaluation},
journal = {Empirical Software Engineering},
year = {2001},
month = {June},
volume = {6},
number = {2},
pages = {111-142}
} |
| 3 | M{\'{a}}rcio Eduardo Delamaro and Jos{\'{e}} Carlos Maldonado and Aditya P. Mathur
Interface Mutation: An Approach for Integration Testing
{IEEE} Trans. Software Eng., 27(3), 2001. |
|
| | Abstract: Available soon... |
| | @ARTICLE{DelamaroMM01,
author = {M{\'{a}}rcio Eduardo Delamaro and Jos{\'{e}} Carlos Maldonado and Aditya P. Mathur},
title = {Interface Mutation: An Approach for Integration Testing},
journal = {{IEEE} Trans. Software Eng.},
year = {2001},
month = {},
volume = {27},
number = {3},
pages = {228--247}
} |
| 4 | Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur
Interface Mutation: An Approach for Integration Testing
IEEE Transactions on Software Engineering, 27(3), May 2001. |
|
| | Abstract: The need for test adequacy criteria is widely recognized. Several criteria have been proposed for the assessment of adequacy of tests at the unit level. However, there remains a lack of criteria for the assessment of the adequacy of tests generated during integration testing. We present a mutation based interprocedural criterion, named Interface Mutation (IM), suitable for use during integration testing. A case study to evaluate the proposed criterion is reported. In the study, the UNIX sort utility was seeded with errors and Interface Mutation evaluated by measuring the cost of its application and its error revealing effectiveness. Alternative IM criteria using different sets of Interface Mutation operators were also evaluated. While comparing the error revealing effectiveness of these Interface Mutation-based test sets with same size randomly generated test sets, we observed that in most cases Interface Mutation based test sets are superior. The results suggest that Interface Mutation offers a viable test adequacy criteria for use at the integration level. |
| | @ARTICLE{DelamaroMM01,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur},
title = {Interface Mutation: An Approach for Integration Testing},
journal = {IEEE Transactions on Software Engineering},
year = {2001},
month = {May},
volume = {27},
number = {3},
pages = {228-247}
} |
| 5 | Sudipto Ghosh and Priya Govindarajan and Aditya P. Mathur
TDS: a Tool for Testing Distributed Component-Based Applications
Proceedings of the 1st Workshop on Mutation Analysis (MUTATION'00)San Jose, California, 6-7 October 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{GhoshGM01,
author = {Sudipto Ghosh and Priya Govindarajan and Aditya P. Mathur},
title = {TDS: a Tool for Testing Distributed Component-Based Applications},
booktitle = {Proceedings of the 1st Workshop on Mutation Analysis (MUTATION'00)},
year = {2001},
address = {San Jose, California},
month = {6-7 October},
pages = {103-112}
} |
| 6 | Sudipto Ghosh and Aditya P. Mathur
Interface Mutation
Software Testing, Verification and Reliability, 11(3), March 2001. |
|
| | Abstract: The need for test adequacy criteria is widely recognized. Several criteria have been proposed for the assessment of adequacy of tests at the unit level. However, there remains a lack of criteria for the assessment of the adequacy of tests generated during integration testing. We present a mutation-based interprocedural criterion, named Interface Mutation (IM), suitable for use during integration testing. A case study to evaluate the proposed criterion is reported. In this study, the UNIX sort utility was seeded with errors and Interface Mutation evaluated by measuring the cost of its application and its error revealing effectiveness. Alternative IM criteria using different sets of Interface Mutation operators were also evaluated. While comparing the error revealing effectiveness of these Interface Mutation-based test sets with same size randomly generated test sets we observed that in most cases Interface Mutation-based test sets are superior. The results suggest that Interface Mutation offers a viable test adequacy criteria for use at the integration level. |
| | @ARTICLE{GhoshM01,
author = {Sudipto Ghosh and Aditya P. Mathur},
title = {Interface Mutation},
journal = {Software Testing, Verification and Reliability},
year = {2001},
month = {March},
volume = {11},
number = {3},
pages = {227-247}
} |
| 7 | Sudipto Ghosh and Aditya P. Mathur
Interface Mutation to Assess the Adequacy of Tests for Componentsand Systems
Proceedings of the 34th International Conference on Technology of Object-Oriented Languages and Systems (TOOLS'00)Santa Barbara, California, 30 July - 4 August 2000. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{GhoshM00,
author = {Sudipto Ghosh and Aditya P. Mathur},
title = {Interface Mutation to Assess the Adequacy of Tests for Componentsand Systems},
booktitle = {Proceedings of the 34th International Conference on Technology of Object-Oriented Languages and Systems (TOOLS'00)},
year = {2000},
address = {Santa Barbara, California},
month = {30 July - 4 August},
pages = {37}
} |
| 8 | Wenliang Du and Aditya P. Mathur
Testing for Software Vulnerability Using Environment Perturbation
Proceeding of the International Conference on Dependable Systems and Networks (DSN'00)New York, NY, 25-28 June 2000. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DuM00,
author = {Wenliang Du and Aditya P. Mathur},
title = {Testing for Software Vulnerability Using Environment Perturbation},
booktitle = {Proceeding of the International Conference on Dependable Systems and Networks (DSN'00)},
year = {2000},
address = {New York, NY},
month = {25-28 June},
pages = {603-612}
} |
| 9 | Marcio Eduardo Delamaro and Jose Carlos Maldonado and Alberto Pasquini and Aditya P. Mathur
Interface Mutation Test Adequacy Criterion: An Empirical Evaluation
State University of Maring\'a, Parana, Brasil, 2000. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{DelamaroMPM00,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado and Alberto Pasquini and Aditya P. Mathur},
title = {Interface Mutation Test Adequacy Criterion: An Empirical Evaluation},
institution = {State University of Maring\'a},
year = {2000},
type = {techreport},
number = {},
address = {Parana, Brasil},
month = {},
} |
| 10 | W. Eric Wong and Joseph R. Horgan and Aditya P. Mathur and Alberto Pasquini
Test Set Size Minimization and Fault Detection Effectiveness: A Case Study in a Space Application
Journal of Systems and Software, 48(2), October 1999. |
|
| | Abstract: An important question in software testing is whether it is reasonable to apply coverage-based criteria as a filter to reduce the size of a test set. An empirical study was conducted using a test set minimization technique to explore the effect of reducing the size of a test set, while keeping block coverage constant, on the fault detection strength of the resulting minimized test set. Two types of test sets were examined. For those with respect to a fixed size, no test case screening was conducted during the generation, whereas for those with respect to a fixed coverage, each subsequent test case had to improve the overall coverage in order to be included. The study reveals that regardless of how a test set is generated, with or without any test case screening, block minimized test sets have a size/effectiveness advantage, in terms of a significant reduction in test set size and with almost the same fault detection effectiveness, over the original non-minimized test sets. |
| | @ARTICLE{WongHMP99,
author = {W. Eric Wong and Joseph R. Horgan and Aditya P. Mathur and Alberto Pasquini},
title = {Test Set Size Minimization and Fault Detection Effectiveness: A Case Study in a Space Application},
journal = {Journal of Systems and Software},
year = {1999},
month = {October},
volume = {48},
number = {2},
pages = {79-89}
} |
| 11 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur
Effect of Test Set Minimization on Fault Detection Effectiveness
Software:Practice and Experience, 28(), 1998. |
|
| | Abstract: Available soon... |
| | @ARTICLE{WongHLM98,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur},
title = {Effect of Test Set Minimization on Fault Detection Effectiveness},
journal = {Software:Practice and Experience},
year = {1998},
month = {},
volume = {28},
number = {},
pages = {347–369}
} |
| 12 | Wenliang Du and Aditya P. Mathur
Vulnerability Testing of Software System Using Fault Injection
Purdue UniversityCOAST TR 98-02, West Lafayette, Indiana, 1998. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{DuM98,
author = {Wenliang Du and Aditya P. Mathur},
title = {Vulnerability Testing of Software System Using Fault Injection},
institution = {Purdue University},
year = {1998},
type = {techreport},
number = {COAST TR 98-02},
address = {West Lafayette, Indiana},
month = {},
} |
| 13 | Eric Wong and Joseph R. Horgan and Aditya P. Mathur and Alberto Pasquini
Test Set Size Minimization and Fault Detection Effectiveness: A Case Study in a Space Application
Proceedings of the 21st Annual International Computer Software and Applications Conference (COMPSAC'07)Washington, DC, 11-15 August 1997. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHMP97,
author = {Eric Wong and Joseph R. Horgan and Aditya P. Mathur and Alberto Pasquini},
title = {Test Set Size Minimization and Fault Detection Effectiveness: A Case Study in a Space Application},
booktitle = {Proceedings of the 21st Annual International Computer Software and Applications Conference (COMPSAC'07)},
year = {1997},
address = {Washington, DC},
month = {11-15 August},
pages = {522-528}
} |
| 14 | Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur
Integration Testing Using Interface Mutation
Proceedings of the seventh International Symposium on Software Reliability Engineering (ISSRE '96)White Plains, New York, 30 October - 02 November 1996. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DelamaroMM96,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur},
title = {Integration Testing Using Interface Mutation},
booktitle = {Proceedings of the seventh International Symposium on Software Reliability Engineering (ISSRE '96)},
year = {1996},
address = {White Plains, New York},
month = {30 October - 02 November},
pages = {112-121}
} |
| 15 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur
Effect of Test Set Minimization on Fault Detection Effectiveness
Proceedings of the 17th International Conference on Software Engineering (ICSE '95)Seattle, Washington, 23-30 April 1995. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHLM95,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur},
title = {Effect of Test Set Minimization on Fault Detection Effectiveness},
booktitle = {Proceedings of the 17th International Conference on Software Engineering (ICSE '95)},
year = {1995},
address = {Seattle, Washington},
month = {23-30 April},
pages = {41-50}
} |
| 16 | W. Eric Wong and Aditya P. Mathur
Fault Detection Effectiveness of Mutation and Data Flow Testing
Software Quality Journal, 4(1), March 1995. |
|
| | Abstract: We report results from an experiment to compare the fault detection effectiveness of mutation, its variants and the all-uses data flow criteria. Adequate test sets were generated randomly, as opposed to by human testers as in some previous studies. We view our results in the light of those from earlier studies comparing mutation with path-oriented testing strategies. We identify and discuss factors that one might consider while evaluating an adequacy criterion for use in practice. Results from our experiments strengthen a hypothesis that an adequacy criterion based on one of the two variants of mutation has superior fault detection effectiveness than that of the all-uses criterion. |
| | @ARTICLE{WongM95a,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Fault Detection Effectiveness of Mutation and Data Flow Testing},
journal = {Software Quality Journal},
year = {1995},
month = {March},
volume = {4},
number = {1},
pages = {69-83}
} |
| 17 | W. Eric Wong and Aditya P. Mathur
Reducing the Cost of Mutation Testing: An Empirical Study
Journal of Systems and Software, 31(3), December 1995. |
|
| | Abstract: Amongst the various testing strategies, mutation testing has been empirically found to be the most effective in detecting faults. However, mutation often imposes unacceptable demands on computing and human resources due to the large number of mutants that need to be compiled and executed on one or more test cases. In addition, the tester needs to examine many mutants and analyze these for possible equivalence with the program under test. For these reasons, mutation is generally regarded by the practicing test engineer as too expensive to use. As one significant component of the cost of mutation is the execution of mutants against test cases, we believe that the cost can be reduced dramatically by reducing the number of mutants that need to be examined. We report the results from a case study designed to investigate two alternatives to reduce the cost of mutation. The alternatives considered are: (1) the randomly selected x'% mutation, and (2) the constrained mutation. We provide experimental data indicating that both alternatives lead to test sets that distinguish a significant number of all mutants and provide high all-uses coverage. |
| | @ARTICLE{WongM95,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Reducing the Cost of Mutation Testing: An Empirical Study},
journal = {Journal of Systems and Software},
year = {1995},
month = {December},
volume = {31},
number = {3},
pages = {185-196}
} |
| 18 | Richard A. DeMillo and Aditya P. Mathur and W. Eric Wong
Some Critical Remarks on a Hierarchy of Fault-Detecting Abilities of Test Methods
IEEE Transactions of Software Engineering, 21(10), October 1995. |
|
| | Abstract: Available soon... |
| | @ARTICLE{DeMilloMW95,
author = {Richard A. DeMillo and Aditya P. Mathur and W. Eric Wong},
title = {Some Critical Remarks on a Hierarchy of Fault-Detecting Abilities of Test Methods},
journal = {IEEE Transactions of Software Engineering},
year = {1995},
month = {October},
volume = {21},
number = {10},
pages = {858-862}
} |
| 19 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur and Md Joseph and R. Horgan
Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness
Proceedings of the 5th International Symposium on Software Reliability EngineeringMonterey, California, 6-9 November 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHLMJH94,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur and Md Joseph and R. Horgan},
title = {Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness},
booktitle = {Proceedings of the 5th International Symposium on Software Reliability Engineering},
year = {1994},
address = {Monterey, California},
month = {6-9 November},
pages = {230-238}
} |
| 20 | Aditya P. Mathur
Mutation Testing
Encyclopedia of Software Engineering, 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{EncyclopediaSE,
author = {Aditya P. Mathur},
title = {Mutation Testing},
booktitle = {Encyclopedia of Software Engineering},
year = {1994},
address = {},
month = {},
pages = {707–713}
} |
| 21 | Richard A. DeMillo and Li. TDsanchi and Aditya P. Mathur
A Two Dimensional Scheme To Evaluate The Adequacy Of Fault Tolerance Testing
Proceedings of the 3rd Workshop on Integrating Error Models with Fault Injection, 25-26 April 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMilloTM94,
author = {Richard A. DeMillo and Li. TDsanchi and Aditya P. Mathur},
title = {A Two Dimensional Scheme To Evaluate The Adequacy Of Fault Tolerance Testing},
booktitle = {Proceedings of the 3rd Workshop on Integrating Error Models with Fault Injection},
year = {1994},
address = {},
month = {25-26 April},
pages = {54-56}
} |
| 22 | W. Eric Wong and Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur
Constrained Mutation in C Programs
Proceedings of the 8th Brazilian Symposium on Software EngneeringCuritiba, Brazil, October 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongDMM94,
author = {W. Eric Wong and Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur},
title = {Constrained Mutation in C Programs},
booktitle = {Proceedings of the 8th Brazilian Symposium on Software Engneering},
year = {1994},
address = {Curitiba, Brazil},
month = {October},
pages = {439-452}
} |
| 23 | Aditya P. Mathur and W. Eric Wong
A Theoretical Comparison Between Mutation and Data Flow Based Test Adequacy Criteria
Proceedings of the 22nd annual ACM Computer Science Conference on Scaling UpPhoenix, Arizona, 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MathurW94a,
author = {Aditya P. Mathur and W. Eric Wong},
title = {A Theoretical Comparison Between Mutation and Data Flow Based Test Adequacy Criteria},
booktitle = {Proceedings of the 22nd annual ACM Computer Science Conference on Scaling Up},
year = {1994},
address = {Phoenix, Arizona},
month = {},
pages = {38-45}
} |
| 24 | Aditya P. Mathur and W. Eric Wong
An Empirical Comparison of Data Flow and Mutation-based Test Adequacy Criteria
Software Testing, Verification and Reliability, 4(1), 1994. |
|
| | Abstract: Evaluation of the adequacy of a test set consisting of one or more test cases is a problem oftes encountered in software testing environments. Two test adequacy criiteria are considered, namely the data flow based all-uses criterion and a mutation based criterion. An empirical study was conducted to compare the difficulty of satisfying the two criteria and their costs. Similar studies conducted in the past are discussed in the light of this study. A discussion is also presented of how and why the results of this study, when viewed in conjunction with the results of earlier comparisons of testing methods, are useful to a software test team. |
| | @ARTICLE{MathurW94,
author = {Aditya P. Mathur and W. Eric Wong},
title = {An Empirical Comparison of Data Flow and Mutation-based Test Adequacy Criteria},
journal = {Software Testing, Verification and Reliability},
year = {1994},
month = {},
volume = {4},
number = {1},
pages = {9 - 31}
} |
| 25 | Byoungju Choi and Aditya P. Mathur
High-performance Mutation Testing
Journal of Systems and Software, 20(2), February 1993. |
|
| | Abstract: Testing a large software program is a time consuming operation. In addition to the time spent by the tester in identifying, locating, and correcting bugs, a significant amount of time is spent in the execution of the program under test and its instrumented or fault-induced variants, also known as mutants. When using mutation testing to achieve high reliability, there can be many such mutants. In this article, we show how a multiple instruction multiple data (MIMD) architecture can be exploited to obtain significant reductions in the total execution time of the mutants. We describe the architecture of the PM othra system, which is designed to provide the tester with a transparent interface to a parallel machine. Experimental results obtained on the Ncube/7 hypercube are presented. The near-linear speedups show the perfect match that exists between the software testing application and a local memory MIMD architecture typified by the Ncube/7 machine. The compilation bottleneck, which could have an adverse effect on the speedup, is illustrated by experimental results. |
| | @ARTICLE{ChoiM93,
author = {Byoungju Choi and Aditya P. Mathur},
title = {High-performance Mutation Testing},
journal = {Journal of Systems and Software},
year = {1993},
month = {February},
volume = {20},
number = {2},
pages = {135-152}
} |
| 26 | Aditya P. Mathur and W. Eric Wong
An Empirical Comparison of Mutation and Data Flow Based Test Adequacy Criteria
Purdue University, West Lafayette, Indiana, 1993. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{MathurW93,
author = {Aditya P. Mathur and W. Eric Wong},
title = {An Empirical Comparison of Mutation and Data Flow Based Test Adequacy Criteria},
institution = {Purdue University},
year = {1993},
type = {techreport},
number = {},
address = {West Lafayette, Indiana},
month = {},
} |
| 27 | W. Eric Wong and Aditya P. Mathur
Reducing the Cost of Mutation Testing: An Empirical Study
Purdue University, West Lafayette, Indiana, 1993. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{WongM93,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Reducing the Cost of Mutation Testing: An Empirical Study},
institution = {Purdue University},
year = {1993},
type = {techreport},
number = {},
address = {West Lafayette, Indiana},
month = {},
} |
| 28 | Aditya P. Mathur
Performance, Effectiveness, and Reliability Issues in Software Testing
Proceedings of the 5th International Computer Software and Applications Conference (COMPSAC'79)Tokyo, Japan, 11-13 September 1991. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Mathur91,
author = {Aditya P. Mathur},
title = {Performance, Effectiveness, and Reliability Issues in Software Testing},
booktitle = {Proceedings of the 5th International Computer Software and Applications Conference (COMPSAC'79)},
year = {1991},
address = {Tokyo, Japan},
month = {11-13 September},
pages = {604-605}
} |
| 29 | Edward W. Krauser and Aditya P. Mathur and Vernon J. Rego
High Performance Software Testing on SIMD Machines
IEEE Transactions on Software Engineering, 17(5), May 1991. |
|
| | Abstract: A method for high-performance, software testing, called mutant unification, is described. The method is designed to support program mutation on parallel machines based on the single instruction multiple data stream (SIMD) paradigm. Several parameters that affect the performance of unification have been identified and their effect on the time to completion of a mutation test cycle and speedup has been studied. Program mutation analysis provides an effective means for determining the reliability of large software systems and a systematic method for measuring the adequacy of test data. However, it is likely that testing large software systems using mutation is computation bound and prohibitive on traditional sequential machines. Current, implementations of mutation tools are unacceptably slow and are only suitable for testing relatively small programs. The proposed unification method provides a practical alternative to the current approaches. The method also opens up a new application domain for SIMD machines. |
| | @ARTICLE{KrauserMR91,
author = {Edward W. Krauser and Aditya P. Mathur and Vernon J. Rego},
title = {High Performance Software Testing on SIMD Machines},
journal = {IEEE Transactions on Software Engineering},
year = {1991},
month = {May},
volume = {17},
number = {5},
pages = {403-423}
} |
| 30 | Richard A. DeMillo and E. W. Krauser and Aditya P. Mathur
Compiler-Integrated Program Mutation
Proceedings of the 5th Annual Computer Software and Applications Conference (COMPSAC'91)Tokyo, Japan, September 1991. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMilloKM91,
author = {Richard A. DeMillo and E. W. Krauser and Aditya P. Mathur},
title = {Compiler-Integrated Program Mutation},
booktitle = {Proceedings of the 5th Annual Computer Software and Applications Conference (COMPSAC'91)},
year = {1991},
address = {Tokyo, Japan},
month = {September},
pages = {351-356}
} |
| 31 | J. R. Horgan and Aditya P. Mathur
Weak Mutation is Probably Strong Mutation
Purdue UniversitySERC-TR-83-P, West Lafayette, Indiana, 1990. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{HorganM90,
author = {J. R. Horgan and Aditya P. Mathur},
title = {Weak Mutation is Probably Strong Mutation},
institution = {Purdue University},
year = {1990},
type = {techreport},
number = {SERC-TR-83-P},
address = {West Lafayette, Indiana},
month = {},
} |
| 32 | Hiralal Agrawal and Richard A. DeMillo and Bob Hathaway and William Hsu and Wynne Hsu and E. W. Krauser and R. J. Martin and Aditya P. Mathur and Eugene Spafford
Design of Mutant Operators for the C Programming Language
Purdue UniversitySERC-TR-41-P, West Lafayette, Indiana, 1989. |
|
| | Abstract: Mutation analysis is a method for reliable testing of large software systems. It provides a method for assessing the adequacy of test data. Mothra [DeMi87] is a mutation analysis based software testing environment that currently supports the testing of Fortran 77 programs. Work is underway to enhance thsi tool along several dimension. One of these is the addition of multilingual capability. C is one of the languages that we plan to support. This report describes the mutant operators designed for the proposed ANSI C programming language. Mutant operators are categorized using syntactic criteria. Such a classification is expected to be useful for an implementor of mutation based testing system. Another classification, useful for the tester, is based on the nature of tests that can be conducted using mutation analysis. This classification exposes the gen erality and completeness of mutation based testing. Each mutant operator s introduced with illustrative examples. The rationale supporting each operator is also provided. An appendix provides a cross-reference of all mutant operators for ease of referencing. The design described here is a result of long deliberations amongst authors of this report in, which several aspects of the C language and program development in C were examined. We intend this report to srve as a manual for thew C mutant operators fir researchers in software testing. |
| | @TECHREPORT{AgrawalDHHHKMMS89,
author = {Hiralal Agrawal and Richard A. DeMillo and Bob Hathaway and William Hsu and Wynne Hsu and E. W. Krauser and R. J. Martin and Aditya P. Mathur and Eugene Spafford},
title = {Design of Mutant Operators for the C Programming Language},
institution = {Purdue University},
year = {1989},
type = {techreport},
number = {SERC-TR-41-P},
address = {West Lafayette, Indiana},
month = {March},
} |
| 33 | Edward William Krauser and Aditya P. Mathur and Vernon Joseph Rego
High Performance Software Testing on SIMD Machines
Proceedings of the 2nd Workshop on Software Testing, Verification, and Analysis (TVA'88)Banff Alberta, July 1988. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{KrauserMR88,
author = {Edward William Krauser and Aditya P. Mathur and Vernon Joseph Rego},
title = {High Performance Software Testing on SIMD Machines},
booktitle = {Proceedings of the 2nd Workshop on Software Testing, Verification, and Analysis (TVA'88)},
year = {1988},
address = {Banff Alberta},
month = {July},
pages = {171 - 177}
} |
| 34 | Aditya P. Mathur and Edward William Krauser
Mutant Unification for Improved Vectorization
Purdue UniversitySERC-TR-14-P, West Lafayette, Indiana, 1988. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{MathurK88,
author = {Aditya P. Mathur and Edward William Krauser},
title = {Mutant Unification for Improved Vectorization},
institution = {Purdue University},
year = {1988},
type = {techreport},
number = {SERC-TR-14-P},
address = {West Lafayette, Indiana},
month = {},
} |
